Applications of Advanced Electron Microscopy Methods in Materials/Chemistry Research

Friday, June 2, 2017
09:00 to 17:00 
McMaster University, Hamilton, ON
Room MDCL 1110, Michael G. DeGroote Centre for Learning and Discovery (To be confirmed) 

Topics
In-situ electron microscopy, electron tomography, atomic-resolution imaging and analysis of 2D materials, energy-related nanomaterials (catalysts, batteries)

Registration is free and including lunch. Space is limited. For more information visit CCEM and select Outreach and Events.

Confirmed Speakers:
Eric Stach, Center for Functional Nanomaterials, Brookhaven National Laboratory, USA
Quentin Ramasse, The National Facility for Aberration Corrected STEM (SuperSTEM), UK
Damien Alloyeau, Laboratoire Matériaux et Phénomènes Quantiques, Université Paris Diderot/CNRS, France
Sarah Haigh, School of Materials, University of Manchester, UK
Miaofang Chi, Center for Nanophase Materials Sciences, Oak Ridge National Lab, USA
Robert Hovden, Materials Science and Engineering, University of Michigan, USA
Christian Kübel, Karlsruhe Institute of Technology, Karlsruhe, Germany

Summary
The Canadian Centre for Electron Microscopy (CCEM) is offering a one-day workshop on applications of advanced electron microscopy of potential use to chemists and materials scientists and engineers. Several international invited speakers will present work and discuss techniques related to liquid-cell in-situ microscopy, electron tomography and atomic-resolution imaging and analysis. The talks will include some discussion of the background of each technique but the focus will be on practical applications – when to use each technique, examples of problems that can be solved, limitations and future perspectives for materials analysis.

This event is supported by the CCEM, the Canada Foundation for Innovation, under the Major Science Initiative program, McMaster University, the Brockhouse Institute for Materials Research and Systems For Research.